ATOMIC-SCALE STRUCTURE OF THE ORTHOCLASE (001)-WATER INTERFACE MEASURED WITH HIGH-RESOLUTION X-RAY REFLECTIVITY
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dc.contributor.author | Fenter P. | |
dc.contributor.author | Teng H. | |
dc.contributor.author | Geissbuhler P. | |
dc.contributor.author | Hanchar J.M. | |
dc.contributor.author | Nagy K.L. | |
dc.contributor.author | Sturchio N.C. | |
dc.date.accessioned | 2021-01-24T07:27:41Z | |
dc.date.available | 2021-01-24T07:27:41Z | |
dc.date.issued | 2000 | |
dc.identifier | https://elibrary.ru/item.asp?id=428706 | |
dc.identifier.citation | Geochimica et Cosmochimica Acta, 2000, 64, 21, 3663-3673 | |
dc.identifier.issn | 0016-7037 | |
dc.identifier.uri | https://repository.geologyscience.ru/handle/123456789/23669 | |
dc.description.abstract | In situ X-ray specular reflectivity and atomic force microscopy were used to determine the structure of the orthoclase (001) cleavage surface in contact with deionized water at 25°C. These are the first in situ measurements of the orthoclase-water interface structure performed to #9ngstrom-scale resolution. The orthoclase (001) cleavage surface has minimal roughness, and only one of two possible surface terminations is exposed. The X-ray data show that (1) the silica network at the orthoclase surface is terminated by an oxygen-containing species (e.g., O or OH) having a coverage of 1.9 +/- 0.25 ML (the expected coverage is 2.0 ML, where 1 ML = 1 atom/55.76 #92), (2) the outermost layer of K+ ions have been removed with a derived coverage of 0.0 +/- 0.08 ML (the bulk truncated K+ coverage is 1.0 ML), and (3) a complex relaxation profile affecting the near-surface structure propagates ~26 #9 into the orthoclase with a maximum relaxation of ~0.15 #9 near the surface. These data are inconsistent with K+ ion depletion below the topmost K+ layer. These results provide a new baseline for understanding the initial steps of the feldspar dissolution process, demonstrate the power of combining X-ray scattering techniques with scanning probe microscopies for understanding the intrinsic characteristics of complex mineral-water interface systems, and suggest a new approach for understanding feldspar dissolution mechanisms. | |
dc.title | ATOMIC-SCALE STRUCTURE OF THE ORTHOCLASE (001)-WATER INTERFACE MEASURED WITH HIGH-RESOLUTION X-RAY REFLECTIVITY | |
dc.type | Статья |
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