FRICTIONAL DISCHARGE PLASMA FROM NATURAL SEMICONDUCTOR/INSULATOR JUNCTIONS: ORIGIN OF SEISMO-ELECTROMAGNETIC RADIATION

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dc.contributor.author Muto J.
dc.contributor.author Nagahama H.
dc.contributor.author Miura T.
dc.contributor.author Arakawa I.
dc.date.accessioned 2025-03-15T04:58:43Z
dc.date.available 2025-03-15T04:58:43Z
dc.date.issued 2006
dc.identifier https://elibrary.ru/item.asp?id=31390709
dc.identifier.citation Physics and Chemistry of the Earth, Parts A/B/C, 2006, 31, 4-9, 346-351
dc.identifier.issn 1474-7065
dc.identifier.uri https://repository.geologyscience.ru/handle/123456789/48502
dc.description.abstract By a pin-on-disk frictional experiment simulating the motion of an asperity on a fault plane, we observed photon emissions from the gap between the quartz disk and pins made of natural semiconductor or insulator minerals during friction. The patterns and intensities of photon emissions depended significantly on the gas pressure, on the normal stress and on the shape and material of the pins. The frictional contacts made of different grain sets or ore veins can be regarded as natural semiconductor/insulator junctions arising from the difference in electron states or work functions between the contacts. During seismic activities, such semiconductor/insulator junctions in natural fault zones would generate discharge plasmas that could be one of origins of seismo-electromagnetic phenomena. Finally, in addition to its effect on the geoelectromagnetic perturbations, the significances of the discovery of discharge plasmas on geochemical reactions on a fault zone arising from tectonic activities are discussed. © 2006 Elsevier Ltd. All rights reserved.
dc.subject ASPERITY
dc.subject FRICTIONAL DISCHARGE PLASMA
dc.subject PIN-ON-DISK METHOD
dc.subject PLASMA PROCESS
dc.subject SEISMO-ELECTROMAGNETIC RADIATION
dc.subject SEMICONDUCTOR/INSULATOR JUNCTION
dc.title FRICTIONAL DISCHARGE PLASMA FROM NATURAL SEMICONDUCTOR/INSULATOR JUNCTIONS: ORIGIN OF SEISMO-ELECTROMAGNETIC RADIATION
dc.type Статья
dc.identifier.doi 10.1016/j.pce.2006.02.040


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