Browsing ELibrary by Author "Eberl D.D."
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Browsing ELibrary by Author "Eberl D.D."
Now showing items 1-16 of 16
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Kile D.E.; Eberl D.D.; Hoch A.R.; Reddy M.M. (2000)Calcite crystal growth experiments were undertaken to test a recently proposed model that relates crystal growth mechanisms to the shapes of crystal size distributions (CSDs). According to this approach, CSDs for minerals ...
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Christidis G.E.; Eberl D.D. (2003)A new method for calculation of layer charge and charge distribution of smectites is proposed. The method is based on comparisons between X-ray diffraction (XRD) patterns of K-saturated, ethylene glycol-solvated, oriented ...
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Aldega L.; Eberl D.D. (2005)Illite crystals in siliciclastic sediments are heterogeneous assemblages of detrital material coming from various source rocks and, at paleotemperatures > 70 degrees C, of superimposed diagenetic modification in the parent ...
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Srodon J.; Eberl D.D.; Drits V.A. (2000)Area-weighted thickness distributions of fundamental illite particles for samples of illite and illite-smectite from seven locations (including bentonites and hydrothermally altered pyroclastics) were measured by Pt-shadowing ...
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Uhlik P.; Sucha V.; Eberl D.D.; Puskelova L.; Caplovicova M. (2000)The Bertaut-Warren-Averbach (BWA) technique and high-resolution transmission electron microscopy (HRTEM) were used to characterize the products of dry-ground pyrophyllite. Mean crystallite thickness and crystallite thickness ...
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Šucha V.; Elsass F.; Eberl D.D.; Kuchta L..; Madejová J.; Komadel P.; Gates W.P. (1998)Synthetic gel and glass of illitic composition, natural kaolinite, and mixed-layer illitesmectite were used as starting materials for hydrothermal synthesis of ammonium illite. Ammonium illite was prepared from synthetic ...
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Blum A.E.; Eberl D.D. (2004)Blum and Eberl (2004) presented a new technique for determining the surface area of clay minerals in sediment samples by measuring the amount of polyvinylpyrrolidone (PVP) [CAS#9003-39-8] adsorbed by a sample, and explained ...
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Eberl D.D.; Nüesch R.; Sucha V.; Tsipursky S. (1998)The thicknesses of fundamental illite particles that compose mixed-layer illite-smectite (I-S) crystals can be measured by X-ray diffraction (XRD) peak broadening techniques (Bertaut-Warren- Averbach (BWA) method and ...
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Shang C.; Rice J.A.; Eberl D.D.; Lin J.-S. (2003)It has been suggested that interstratified illite-smectite (I-S) minerals are composed of aggregates of fundamental particles. Many attempts have been made to measure the thickness of such fundamental particles, but each ...
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Eberl D.D.; Kile D.E.; Drits V.A. (2002)Geological interpretations of crystal size distributions (CSDs) depend on understanding the crystal growth laws that generated the distributions. Most descriptions of crystal growth, including a population-balance modeling ...
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Kile D.E.; Eberl D.D. (2003)Crystal growth experiments were conducted using potassium alum and calcite crystals in aqueous solution under both non-stirred and stirred conditions to elucidate the mechanism for size-dependent (proportionate) and ...
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Środoń J.; Drits V.A.; McCarty D.K.; Hsieh J.C.C.; Eberl D.D. (2001)An internal standard X-ray diffraction (XRD) analysis technique permits reproducible and accurate calculation of the mineral contents of rocks, including the major clay mineral families: Fe-rich chlorites + berthierine, ...
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Dudek T.; Środoón J.; Eberl D.D.; Elsass F.; Uhlik P. (2002)Two independent methods of crystal-size distribution analysis were compared: the Bertaut-Warren-Averbach XRD technique (MudMaster computer program) and high-resolution transmission electron microscopy (HRTEM). These ...
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Šucha V.; Środoń J.; Clauer N.; Elsass F.; Eberl D.D.; Kraus I.; Madejová J. (2001)Weathering profiles developed on the top surface of a bentonite (containing Al-Mg montmorillonite) and a K-bentonite (containing mixed-layer illite-smectite (I-S)) under Central European temperate conditions were studied ...
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Drits V.; Środoń J.; Eberl D.D. (1997)The standard form of the Scherrer equation, which has been used to calculate the mean thickness of the coherent scattering domain (CSD) of illite crystals from X-ray diffraction (XRD) full width data at half maximum (FWHM) ...
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Drits V.A.; Eberl D.D.; Środon J. (1998)A modified version of the Bertaut-Warren-Averbach (BWA) technique (Bertaut 1949, 1950; Warren and Averbach 1950) has been developed to measure coherent scattering domain (CSD) sizes and strains in minerals by analysis of ...
Now showing items 1-16 of 16
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