Browsing ELibrary by Author "Fenter P."
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Browsing ELibrary by Author "Fenter P."
Now showing items 1-9 of 9
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Fenter P.; Teng H.; Geissbuhler P.; Hanchar J.M.; Nagy K.L.; Sturchio N.C. (2000)In situ X-ray specular reflectivity and atomic force microscopy were used to determine the structure of the orthoclase (001) cleavage surface in contact with deionized water at 25°C. These are the first in situ measurements ...
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Fenter P.; Park C.; Cheng L.; Zhang Z.; Krekeler M.P.S.; Sturchio N.C. (2003)Initial dissolution kinetics at orthoclase (001) and (010) cleavage surfaces were measured for ~2 to 7 monolayers as a function of temperature using in situ X-ray reflectivity. The sensitivity of X-ray reflectivity to probe ...
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Teng H.H.; Fenter P.; Cheng L.; Sturchio N.C. (2001)Direct measuremens of orthoclase (001) were performed using in situ atomic force microscopy (AFM) and synchrotron X-ray reflectivity to reveal the Α-scale dissolution process as a function of pH and temperature. Distinct ...
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Fenter P.; Sturchio N.C. (1999)The adsorption of organic molecules at mineral-fluid interfaces has a profound influence upon geochemical reaction and transport processes, yet little is known about the in situ structures or properties of organic layers ...
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Park C.; Fenter P.; Zhang Z.; Cheng L.; Sturchio N.C. (2004)A complete understanding of the surface chemistry of the apatite-water system requires direct observation of the interfacial structure at the molecular scale. We report results for the structure of the apatite (100)-water ...
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STRUCTURE OF THE ORTHOCLASE (001)- AND (010)-WATER INTERFACES BY HIGH-RESOLUTION X-RAY REFLECTIVITY Fenter P.; Cheng L.; Park C.; Zhang Z.; Sturchio N.C. (2003)High-resolution in situ X-ray specular reflectivity was used to measure the structures of orthoclase (001) and (010) cleavage surfaces in contact with deionized water at 25°C. X-ray reflectivity data demonstrate a high ...
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Schlegel M.L.; Nagy K.L.; Fenter P.; Sturchio N.C. (2002)The structures of prismatic (100) and pyramidal (101) growth faces of natural quartz crystals, and their modification upon annealing at T =< 400°C were investigated ex situ by atomic force microscopy (AFM) and in water by ...
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Fenter P.; Geissbuhler P.; DiMasi E.; Srajer G.; Sorensen L.B.; Sturchio N.C. (2000)High-resolution, in situ X-ray reflectivity measurements were made of the calcite (104)-water interface in calcite-saturated aqueous solutions at pH values ranging from 6.8 to 12.1 and low PCO2. The X-ray reflectivity data, ...
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Cheng L.; Fenter P.; Sturchio N.C.; Zhong Z.; Bedzyk M.J. (1999)The location and orientation of arsenite incorporated at the CaCO3 (1014) cleavage surface from a dilute aqueous solution was examined with the X-ray standing wave (XSW) technique. The high coherent fractions measured for ...
Now showing items 1-9 of 9
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