APPLICATIONS OF NEW SURFACE ANALYSIS TECHNIQUES (NMA AND XPS) TO HUMIC SUBSTANCES

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dc.contributor.author Mercier F.
dc.contributor.author Moulin V.
dc.contributor.author Guittet M.J.
dc.contributor.author Barré N.
dc.contributor.author Gautier-Soyer M.
dc.contributor.author Trocellier P.
dc.contributor.author Toulhoat P.
dc.date.accessioned 2021-06-15T10:59:47Z
dc.date.available 2021-06-15T10:59:47Z
dc.date.issued 2002
dc.identifier https://elibrary.ru/item.asp?id=13942041
dc.identifier.citation Organic Geochemistry, 2002, 33, 3, 247-255
dc.identifier.issn 0146-6380
dc.identifier.uri https://repository.geologyscience.ru/handle/123456789/29064
dc.description.abstract This paper illustrates the potentialities and the innovative character of surface analysis techniques such as nuclear microprobe analysis (NMA) and X-ray photoelectron spectroscopy (XPS) in the research field of humic substances (HS), in particular to characterize HS/trace elements association. NMA showed its potentialities to characterize HS/trace element associations at the microscopic scale and quantification of trace elements scavenged by humic acids (HA) and distribution and thickness of HA films sorbed onto silica surfaces after sorption tests. XPS was used to determine the chemical environment of iodine in natural HS. These techniques enabled us to establish association between HS colloids and numerous trace elements (both cations and anions, especially I) and to evidence a strong affinity of the smallest HA colloids (
dc.title APPLICATIONS OF NEW SURFACE ANALYSIS TECHNIQUES (NMA AND XPS) TO HUMIC SUBSTANCES
dc.type Статья


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