NEW MODELING OF X-RAY DIFFRACTION BY DISORDERED LAMELLAR STRUCTURES, SUCH AS PHYLLOSILICATES
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dc.contributor.author | Plançon A. | |
dc.date.accessioned | 2021-10-14T07:45:24Z | |
dc.date.available | 2021-10-14T07:45:24Z | |
dc.date.issued | 2002 | |
dc.identifier | https://elibrary.ru/item.asp?id=14447811 | |
dc.identifier.citation | American Mineralogist, 2002, 87, 11-12, 1672-1677 | |
dc.identifier.issn | 0003-004X | |
dc.identifier.uri | https://repository.geologyscience.ru/handle/123456789/30699 | |
dc.description.abstract | The “classical” modeling of powder X-ray diffraction (XRD) patterns of lamellar structures, such as phyllosilicates, assumes that the samples are composed of “crystals” having various thickness and well-defined translations between layers. This model is able to describe the high-angle domain of XRD patterns but sometimes fails in the low-angle region. The new model proposed here considers the samples to be composed of “particles” that have larger sizes than crystals and contain defects such as cracks, inner-porosity, bent layers, edge dislocations, etc. These defects induce variations in the d-spacings, introduced in the calculation by distributions of the d-spacings. For phyllosilicates, this model is consistent not only with XRD, but also with small-angle X-ray scattering (SAXS) data, transmission electron microscopy (TEM) results, and high-resolution transmission electron microscopy (HRTEM) observations. | |
dc.title | NEW MODELING OF X-RAY DIFFRACTION BY DISORDERED LAMELLAR STRUCTURES, SUCH AS PHYLLOSILICATES | |
dc.type | Статья |
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