Abstract:
Laser-ablation ICPMS has become widely accessible as a powerful and efficient multi-element microanalytical technique. One of its key strengths is the ability to analyse a wide concentration range from major (tens of wt.%) to trace (ng/g) levels in minerals and their microscopic inclusions. An ArF excimer laser system (λ = 193 nm) with imaging optics for controlled UV ablation and simultaneous petrographic viewing was designed specifically for representative sampling and quantitative multi-element analysis of microscopic fluid, melt and mineral inclusions beneath the sample surface. After a review of the requirements and recent technical developments, results are presented which together document the reliability and reproducibility of quantitative microanalysis of complex samples such as zoned crystals or fluid and melt inclusions in various host minerals. Analytical errors due to elemental fractionation are reduced to the typical precision achieved by quadrupole LA-ICPMS in multi-element mode (2–5% RSD). This progress is largely due to the small size of aerosol particles generated by the optimized UV optical system. Depth profiling yields representative and accurate concentration results at a resolution of ∼0.1 μm perpendicular to the ablation surface. Ablation is largely matrix-insensitive for different elements, such that silicate and borate glasses, silicates and oxide minerals, or direct liquid ablation can be used interchangeably for external standardization of any homogeneous or heterogeneous material. The absolute ablation rate is material dependent, however, so that quantitative LA-ICPMS analysis requires an internal standard (i.e., an independent constraint such as the absolute concentration of one element).
