ACCURATE QUANTIFICATION OF MELT INCLUSION CHEMISTRY BY LA-ICPMS: A COMPARISON WITH EMP AND SIMS AND ADVANTAGES AND POSSIBLE LIMITATIONS OF THESE METHODS
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dc.contributor.author | Pettke T. | |
dc.contributor.author | Halter W.E. | |
dc.contributor.author | Aigner-Torres M. | |
dc.contributor.author | Heinrich C.A. | |
dc.contributor.author | Webster J.D. | |
dc.date.accessioned | 2022-10-20T08:59:37Z | |
dc.date.available | 2022-10-20T08:59:37Z | |
dc.date.issued | 2004 | |
dc.identifier | https://elibrary.ru/item.asp?id=14424403 | |
dc.identifier.citation | Lithos, 2004, 78, 4, 333-361 | |
dc.identifier.issn | 0024-4937 | |
dc.identifier.uri | https://repository.geologyscience.ru/handle/123456789/38981 | |
dc.description.abstract | Laser ablation inductively coupled plasma mass spectrometry (LA-ICPMS) has recently emerged as a powerful in situ microanalytical technique for major to trace elements in heterogeneous samples such as fluid and melt inclusions. Here, a rigorous comparison of melt inclusion (MI) data acquired by electron microprobe (EMP), ion microprobe (the secondary ion mass spectrometry, SIMS) and LA-ICPMS is used to evaluate the applicability and advantages/drawbacks of these approaches. We are specifically interested in determining if LA-ICPMS data on entire, unexposed, crystallized MI that cannot be homogenized in the lab are accurate and of a useful precision. | |
dc.subject | crystallized melt inclusions | |
dc.subject | analytical accuracy | |
dc.subject | inductively-coupled-plasma mass-spectrometry | |
dc.subject | secondary ion mass spectrometry | |
dc.title | ACCURATE QUANTIFICATION OF MELT INCLUSION CHEMISTRY BY LA-ICPMS: A COMPARISON WITH EMP AND SIMS AND ADVANTAGES AND POSSIBLE LIMITATIONS OF THESE METHODS | |
dc.type | Статья |
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