Characterization of NH4-phlogopite (NH4) (Mg3) [AlSi3O10] (OH)2 and ND4-phlogopite (ND4) (Mg3) [AlSi3O10] (OD)2 using IR spectroscopy and Rietveld refinement of XRD spectra

Abstract

A synthesis technique is described which results in >99% pure NH4-phlogopite (NH4) (Mg3) [AlSi3O10] (OH)2 and its deuterium analogue ND4-phlogopite (ND4) (Mg3) [AlSi3O10] (OD)2. Both phases are characterised using both IR spectroscopy at 298 and 77 K as well as Rietveld refinement of their X-ray powder diffraction pattern. Both NH4nt size=-1>+d ND4nt size=-1>+e found to occupy the interlayer site in the phlogopite structure. Absorption bands in the IR caused by either NH4nt size=-1>+ ND4nt size=-1>+n be explained to a good approximation using Tdmmetry as a basis. Rietveld refinement indicates that either phlogopite synthesis contains several mica polytypes. The principle polytype is the one-layer monoclinic polytype (1M), which possesses the space group symmetry C2/m. The next most common polytype is the two-layer polytype (2M15>) with space group symmetry C2/c. Minor amounts of the trigonal polytype 3T with the space group symmetry P31were found only in the synthesis run for the ND4logopite. Electron microprobe analyses indicate that NH4logopite deviates from the ideal phlogopite composition with respect to variable Si/Al and Mg/Al on both the tetrahedral and octahedral sites, respectively, due to the Tschermaks substitution VIMg2++IVSi4+↔VIAl3++IVAl3+ and with respect to vacancies on the interlayer site due to the exchange vector XII(NH4)++IVAl3+↔XII+IVSi4+