TEM CHARACTERIZATION OF DISLOCATIONS AND SLIP SYSTEMS IN STISHOVITE DEFORMED AT 14 GPA, 1,300°C IN THE MULTIANVIL APPARATUS

Abstract

Transmission electron microscopy (TEM) has been used to investigate deformation microstructures of synthetic stishovite specimens deformed at 14 GPa, 1,300°C. Geometrical characteristics of numerous dislocations have been characterized by dislocation contrast and stereographic analyses in order to identify the easy slip systems of stishovite. TEM data allowed us to characterize the following slip systems: 〈100〉{001}, 〈100〉{010}, 〈100〉{021}, [001]{100}, [001]{110}, [001]{210} and $\langle 110\rangle \{1\bar{1}0\}.$ Observation of sub-grain boundaries and scalloped edge dislocations suggest that climb has been activated in the specimens.